Keynote Speakers

Professor Albert Weckenmann

1971, Award: Dr.-Ing. of the faculty of electrical engineering of the University (TH) of Karlsruhe.

1972 - 1975, Robert Bosch GmbH, Nuremberg. R & D engineer. Head of the group: Conception of new products to be applied in motor vehicles.

1975 - 1992, Univ.-Professor for metrology and precision engineering in the department mechanical engineering of the university of the federal armed forces Hamburg.

1992 - present, Univ.-Professor of the University of Erlangen-Nuremberg, and Chair Quality Management and Manufacturing Metrology.

A Weckenmann


Dr. honoris causa of Technical University Cluj-Napoca, Romania; Dr. honoris causa of University of Bielsko-Biala, Poland; Dr.-Ing. E.h. of Technical University Ilmenau, Germany; Honorary Professor of Tianjin University, China; Fellow of CIRP (The International Academy of Production Engineering); Chairman of STC-P (Precision Engineering); Chaiman of IMEKO TC 14 (Measurement of geometrical quantities); Medal of honour for prominent achievements of VDI; About 400 publications including some books; Organizer and chairman of several national and international Conferences, initiator and Coordinator of the DFG-funded Priority Programme: Innovative strategies for measurement and verification of  Microsystems and nano-structures in Production; Initiator and spokesman of the DFG funded Collaborative research centre: Integration of electronic components into mobile systems.


Since the first applications of computed tomography (CT) for medical diagnostics in the 1970s, the technology has been rapidly adopted for non-destructive testing of casted workpieces or complex assemblies. In 2005 the first coordinate measuring machine with CT sensor has been presented for application in manufacturing metrology and quality control. Today there exist numerous different manufacturers as the benefits for metrology are convincing. CT offers the possibility to acquire a measurement object holistically, i.e. the whole volume of the object, not only the surface, with a very high point density of typically several millions of points.

CT measurement always starts with an acquisition of the entire measurement object. It is radiated in different views during a 360° rotation. The acquired radiographies are reconstructed to a dataset (“volumetric model”) representing the entire volume of the measurement object. In contrast to conventional tactile or optical CMMs, measurements are not limited to the exterior surface of the measurement object, it is possible to measure inner or hidden features as well, e.g. undercuts. Additionally virtual cross sections may be used for direct comparisons against CAD data or technical drawings without destroying the actual workpiece. The evaluation of all features defined in CAD model or drawing may be analyzed using a single dataset. It is possible the data for later analyses, e.g. evaluation of further features or process control.

Current research and development activities are focused on several different aspects of CT. At first the machine components are analyzed and improved with respect to application in metrology. Larger detectors with better resolution or X-ray tubes with smaller focal spots may help in improving the machine’s accuracy. Secondly algorithms for reconstruction and artifact reduction are developed especially for metrological purpose. As technical measurement objects feature a greater variety of material properties than in medical diagnostics, different strategies have to be investigated. The most crucial point is that not only the image quality of the radiographies or the reconstructed data is important; the measurement accuracy plays the decisive role. Finding the interrelation between image quality and measurement accuracy is an important research topic. Thirdly from a metrological point view the determination of measurement accuracy and measurement uncertainty for CT measurements is an important task. Methods for experimental and simulation-based uncertainty determination are developed at the time being.

An important challenge in the application of computed tomography for quality control is how to deal with assemblies of different materials. Due to different material properties in terms of X-ray absorption, it is currently not possible to measure components consisting of light material (e.g. plastics) and metal. First attempts trying to overcome these limitations by combining data acquired with different X-ray energies (“multi energy CT”) will be shown.


Dr Vijay Srinivasan

Dr. Vijay Srinivasan is the Chief of the Systems Integration Division in the Engineering Laboratory at the National Institute of Standards and Technology, U.S.A. Dr. Srinivasan comes to NIST from IBM, where he was most recently the Chief Standards and Solutions Officer for Product Lifecycle Management (PLM); and Program Manager for PLM Research, Standards, and Academic Programs at IBM.  In this capacity, he set the IBM standards vision and strategy for PLM work and was responsible for implementing these standards in IBM’s PLM products through nearly 50 IBM staff members worldwide.  Dr. Srinivasan has been a vocal and constant voice for the use of open standards in IBM PLM products – a business line at IBM with over 1 billion dollars of annual revenue. Before that, he was a line manager in IBM’s T.J. Watson Research Center leading research in the areas of geometric modeling, CAD/CAM, robotics, standards for geometric dimensioning and tolerancing, and data exchange.  

V Srinivasan

Dr. Srinivasan also served as an adjunct professor of mechanical engineering at Columbia University, where he has taught geometric modeling & computations and integrated product development. He was a member of the Technical Advisory Committee of the standards consortium PDES Inc., and industrial advisor to ProSTEP iViP consortium. He is the Chairman of the US Technical Advisory Group to ISO/TC 213. Dr. Srinivasan is a founding member of the American Society of Mechanical Engineers (ASME) Y14.5.1 committee on mathematical definitions of GD&T, and is an ASME Fellow. He has published widely, and his book, "Theory of Dimensioning: An introduction to parameterizing geometric models" was published by Marcel-Dekker in 2004. He recently co-authored a book on "SOA Approach to Enterprise Integration for Product Lifecycle Management."


Dimensioning and tolerancing standards originated about 75 years ago in various national and company standards that governed engineering draughting and documentation practices. They served the purpose of communicating to manufacturers what geometric variations designers can tolerate in a product without compromising the product’s intended function. These standards have evolved over time and are by now well entrenched in the engineering profession throughout the world. For several initial decades, this evolution was driven primarily by codification of best engineering practices without the benefit of any systematic scientific treatment. This trend encountered a major challenge in early 1980s when the emergence of computer-aided design and manufacturing systems forced a drastic reexamination of these standards with a greater emphasis on mathematical formalism. Since then scientific principles to explain past practices and to guide future evolution have emerged, and the role of science has now become more prominent in these standards development. In this talk I will outline some of the key scientific research results that have already made an impact, and future scientific trends that are likely to have an influence, on these evolving standards.              


Dr Henrik S Nielsen

Dr Nielsen is the chairman of ISO Technical Committee 213 “Geometrical Product Specifications and Verification”. He has held this position since 2008 and has been an expert serving on related committees since 1988. He has served as project leader and author of numerous ISO standards. Dr Nielsen has authored or co-authored various books and training material primarily aimed at the industrial GPS practitioner.


Dr Nielsen is the president of HN Metrology Consulting. His areas of expertise include geometrical product specifications, dimensional and geometrical metrology, uncertainty estimation, and quality assurance for test and calibration laboratories.

H Nielsen


Dr Nielsen holds a M. Sc. In Mechanical Engineering and a Ph. D. in Metrology, both from the Technical University of Denmark. Prior to founding HN Metrology Consulting in 1998, Dr Nielsen was the Technical Manager of Corporate Standards at Cummins Engine Co. in Columbus, Indiana, USA. He has resided in the United States since 1991.


In this address, Dr Nielsen will start by discussing recent developments in ISO TC 213, the committee which publishes the ISO-GPS standards. Over the last 2 years TC 213 has published about 25 standards, more than double the number of the preceding 4 years. This rapid development has brought many significant changes to the ISO-GPS system. Dr Nielsen will give an overview of the more important ones. The work is now at a crossroads, where items that have been on the TC 213 work program for many years have been completed. This has allowed TC 213 to start new strategic initiatives that will guide the development of ISO-GPS standards over the next 8-10 years. Dr Nielsen will outline the two stages of the strategic plan, the changes to the ISO-GPS standards complex that is envisioned, and how it will impact the users of these standards; whether they are part the specification community or the verification community.

Professor David Whitehouse

Professor David Whitehouse is the world authority on surface and nanometrology theoretically and practically. He has a B.Sc. in Physics, Ph. D. in Surface Tribology and D.Sc. in Metrology. He has published over 250 papers on surface and nanometrology, has 23 patents and has written six books including the definitive ‘Handbook of Surface Metrology’ and ‘Handbook of Surface and Nanometrology’. Over 50% of all these publications are by himself alone He has been honoured many times in the 37 countries where he has lectured. In a recent lifetime award for a distinguished career the American Society of Precision engineers described Professor Whitehouse as the ‘Father of Digital Metrology’. He also has a lifetime award from the UK National Physical Laboratory.


He spent over 20 years in industry including ten years as Chief Research Engineer at Taylor Hobson Ltd. UK. After this he spent 23 years as Full Professor of Engineering Science at the University of Warwick UK for the last 5 of which he was Chief Scientist in the School of Engineering. He is now Emeritus Professor. In 1990 he initiated the world’s first Journal of Nanotechnology published by the Institute of Physics and in 1979 he started the first ‘Centre for Micro and Nano Engineering.’

Important Deadlines

Abstract submission
21st Sept, 2011
Acceptance notification
24th Oct, 2011
Paper submission
3nd Jan, 2012
Final Paper due deadline
19th Feb, 2012